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Advances in Scanning Microwave Impedance Microscopy

Published online by Cambridge University Press:  30 July 2020

Ravi Chandra Chintala  and
Yongliang Yang
Ravi Chandra Chintala
Affiliation:
Primenano, Inc.,Santa Clara, California, United States
Yongliang Yang
Affiliation:
Primenano, Inc.,Santa Clara, California, United States

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Probe Microscopy and Nanomechanics
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2494 - 2495
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Copyright
Copyright © Microscopy Society of America 2020

References

Lai, et al. , Applied Nanoscience (2011) 1:13–1810.1007/s13204-011-0002-7CrossRefGoogle Scholar
Lai, et al. , Review of Scientific Instruments 80, 043707 (2009)Google Scholar
Scrymgeour, A. et al. . / Applied Surface Science 423 (2017) 1097–110210.1016/j.apsusc.2017.06.261CrossRefGoogle Scholar
Tselev, et al. , ACS Nano 2016, 10, 3, 3562-357010.1021/acsnano.5b07919CrossRefGoogle Scholar