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Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials

Published online by Cambridge University Press:  30 July 2020

Pawel Nowakowski ,
Mary Ray  and
Paul Fischione
Pawel Nowakowski
Affiliation:
E.A. Fischione Instruments Inc., Export, Pennsylvania, United States
Mary Ray
Affiliation:
E.A. Fischione Instruments Inc., Export, Pennsylvania, United States
Paul Fischione
Affiliation:
E.A. Fischione Instruments Inc., Export, Pennsylvania, United States

Abstract

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Type
Vendor Symposium - Materials Preparation
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1982 - 1984
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Copyright
Copyright © Microscopy Society of America 2020

References

Nowakowski, P., Wiezorek, J., Spinelli, I., Ray, M., & Fischione, P. (2019). Elastic and plastic strain measurement using electron backscatter diffraction technique: The influence of sample preparation. Microscopy and Microanalysis, 25(S2), 534-535.10.1017/S1431927619003404CrossRefGoogle Scholar
Nowakowski, P., Bonifacio, C., Ray, M., & Fischione, P. (2019). Combining emerging sample preparation methods, SEM, and TEM investigations for microelectronics device characterization at multiple scales. Microscopy and Microanalysis, 25(S2), 688-689.10.1017/S1431927619004173CrossRefGoogle Scholar
Nowakowski, P., Wiezorek, J., Bathula, V., Mielo, S., Khanal, S., Bonifacio, C., & Fischione, P. (2018). SEM and TEM characterization of plastic deformation structures in aluminum by EBSD, TKD, and PED-based orientation imaging techniques. Microscopy and Microanalysis, 24(S1), 2182-2183.10.1017/S143192761801139XCrossRefGoogle Scholar
Nowakowski, P., Bonifacio, C. S., Campin, M. J., Ray, M. L., Fischione, P. E., & Mathieu, S. (2017). EBSD and TEM microstructural studies of new fuel cladding in generation IV sodium-cooled fast nuclear reactors. Microscopy and Microanalysis, 23(S1), 2224-2225.10.1017/S1431927617011783CrossRefGoogle Scholar
Nowakowski, P., Schlenker, J., Ray, M., & Fischione, P. (2016). Sample preparation using broad argon ion beam milling for electron backscatter diffraction (EBSD) analysis. Microscopy and Microanalysis, 22(S3), 12-13.10.1017/S143192761600091XCrossRefGoogle Scholar
Wright, I., Nowell, M.M., Field, D.P., (2011). A Review of Strain Analysis Using Electron Backscatter Diffraction Microscopy and Microanalysis, 17, 316-329.Google Scholar
Katrakova, F. Mucklich, (2002). Specimen preparation for electron backscatter diffraction - Part II: Ceramics, Pract. Metallog. 39, 644-662Google Scholar