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Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
E. P. Bellido
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
M. Bugnet
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
N. Gauquelin
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, CanadaNow at EMAT, University of Antwerp, Antwerp, Belgium
S. Prabhudev
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
D. Rossouw
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, CanadaNow with Department of Materials Science and Metallurgy, University of Cambridge, UK
S. Stambula
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S.Y. Woo
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
G.-Z. Zhu
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
H. Zhang
Affiliation:
CIfAR Quantum Materials Program and Dept of Physics, Univ. of Toronto, Toronto, ON, Canada
J.Y.T. Wei
Affiliation:
CIfAR Quantum Materials Program and Dept of Physics, Univ. of Toronto, Toronto, ON, Canada
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[4]Rossouw, D., Bugnet, M., Botton, G.A. Physical Review B 87, 125403 (2013).Google Scholar
[5]
[5]Rossouw, D., Botton, G.A. Physical Review Letters 110, 066801 (2013).Google Scholar
[6]
[6]Bellido, E.P., et al., to appear in Microscopy and Microanalysis.Google Scholar
[7]
[7] The Authors are grateful to NSERC for supporting this research. The microscopy was carried out at the Canadian Centre for Electron Microscopy, a National facility supported by NSERC and McMaster.Google Scholar