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Advances in EELS Instrumentation: A New Design High-Vacuum Parallel EELS System

Published online by Cambridge University Press:  08 April 2017

R Twesten ,
C Trevor ,
M Barfels ,
Y Sato ,
N Menon ,
P Thomas  and
A Gubbens
R Twesten
Affiliation:
Gatan Inc
C Trevor
Affiliation:
Gatan Inc
M Barfels
Affiliation:
Gatan Inc
Y Sato
Affiliation:
Gatan Inc
N Menon
Affiliation:
Gatan Inc
P Thomas
Affiliation:
Gatan Inc
A Gubbens
Affiliation:
Gatan Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1168 - 1169
Copyright
Copyright © Microscopy Society of America 2011