Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-28T20:27:43.949Z Has data issue: false hasContentIssue false
  • English
  • Français

Advances in Beam-sensitive Sample Preparation and Observation

Published online by Cambridge University Press:  22 July 2022

Pawel Nowakowski ,
Cecile Bonifacio ,
Mary Ray  and
Paul Fischione
Pawel Nowakowski*
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
Cecile Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
Mary Ray
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
Paul Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2214 - 2215
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Shi, J, Yang, Y, Shao, H, Journal of Membrane Science 547 (2018), p. 1-10. doi:10.1016/j.memsci.2017.10.033Google Scholar
Donga, H, Xiao, X, Jin, Ch, Wang, X, Tang, P, Wang, Ch, Yin, Y, Wang, D, Yang, S, Wud, Ch, Journal of Power Sources 423 (2019), p. 72-79. doi:10.1016/j.jpowsour.2019.03.032Google Scholar
Zhang, Y, Zuo, T-T, Popovic, J., Lim, K, Yin, Y-X, Maier, J, Guo, Y-G, Materials Today 33 (2020), p. 56-74. doi:10.1016/j.mattod.2019.09.018CrossRefGoogle Scholar