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Advancements in X-Ray Analysis for Correlative Microscopy

Published online by Cambridge University Press:  01 August 2018

Jeff Gelb ,
Sylvia Lewis ,
SH Lau ,
Janos Kirz  and
Wenbing Yun
Jeff Gelb
Affiliation:
Sigray, Inc., Concord, CA, USA
Sylvia Lewis
Affiliation:
Sigray, Inc., Concord, CA, USA
SH Lau
Affiliation:
Sigray, Inc., Concord, CA, USA
Janos Kirz
Affiliation:
Sigray, Inc., Concord, CA, USA Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Wenbing Yun
Affiliation:
Sigray, Inc., Concord, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 358 - 359
Copyright
© Microscopy Society of America 2018 

References

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