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Advanced Large Area Sample Preparation for Electron Microscopy using Initial Notches
Published online by Cambridge University Press: 22 July 2022
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
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- Copyright
- Copyright © Microscopy Society of America 2022
References
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Financial support from Deutsche Forschungsgemeinschaft (DFG) in Bonn Bad Godesberg (Germany) under grant PA 3097/1-1 and by the European Union via the Europäischer Fonds für Regionale Entwicklung (EFRE) and the Investitionsbank Sachsen-Anhalt (Germany) through the project FIBNotch under the grant number 2004/00071 is gratefully acknowledged.Google Scholar
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