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Advanced EDS and µXRF Analysis of Earth and Planetary Materials using Spectrum Imaging, Computer-Controlled SEM and an Annular SDD

Published online by Cambridge University Press:  27 August 2014

T. Salge ,
R. Tagle ,
L. Hecht ,
L. Ferriere ,
A.D. Ball ,
A. T. Kearsley ,
C. Smith  and
C. Jones
T. Salge
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
R. Tagle
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
L. Hecht
Affiliation:
Museum für Naturkunde, Invalidenstraße 43, 10115 Berlin, Germany
L. Ferriere
Affiliation:
Naturhistorisches Museum, Burgring 7, A-1010 Vienna, Austria
A.D. Ball
Affiliation:
Science Facilities, Natural History Museum, Cromwell Road, London, SW7 5BD, United Kingdom
A. T. Kearsley
Affiliation:
Science Facilities, Natural History Museum, Cromwell Road, London, SW7 5BD, United Kingdom
C. Smith
Affiliation:
Science Facilities, Natural History Museum, Cromwell Road, London, SW7 5BD, United Kingdom
C. Jones
Affiliation:
Science Facilities, Natural History Museum, Cromwell Road, London, SW7 5BD, United Kingdom

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1716 - 1717
Copyright
Copyright © Microscopy Society of America 2014