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Adhesion and Nanomechanical Studies by Interfacial Force Microscopy

Published online by Cambridge University Press:  02 July 2020

J. E. Houston
J. E. Houston*
Affiliation:
Sandia National Laboratories, Albuquerque, NM87185-1413
*
*Work supported by U.S. Department of Energy under Contract No. DE-AC04-94AL85000.
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Extract

Scanning probe techniques have shown dramatic growth recently and are presently making significant impact on surface and interfacial problems in material science. The Interfacial Force Microscopy (IFM) differs from other scanning force-probe techniques by its use of a self-balancing, zero compliance force sensor. This allows carefully controlled and mechanically stable force vs. interfacial separation measurements to be obtained which yield unique and valuable information concerning the interfacial adhesive bond and its failure, as well as enabling the study of the mechanical properties of materials, both on the nanometer scale. I will demonstrate the enhanced capabilities of the IFM by presenting two examples involving: 1) the bonding interaction between chemically distinct end groups on self assembling molecules adsorbed on both the sample and probe tip and 2) a study of the effect of morphological defects on the nanomechanical properties of Au(l 11) single-crystal surfaces

Interfacial adhesion is of extraordinary technological importance and has long been of intense scientific interest.

Type
Scanned Probe Microscopies: Technologies, Methodologies, and Applications
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1277 - 1278
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Thomas, R. C., Houston, J. E., Crooks, R. M., Kim, T. and Michalske, T. A., J. Amer. Chem. Soc. 112, 3830 (1995).10.1021/ja00118a019CrossRefGoogle Scholar
2.Kiely, J. D., Hwang, R. Q. and Houston, J. E. (In Preparation).Google Scholar