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Accurate Calculation of CBED Patterns for 4D STEM Using Electron Densities Calculated by Density Functional Theory.

Published online by Cambridge University Press:  01 August 2018

Mark P. Oxley ,
Axiel Yael Birenbaum ,
Tribhuwan Pandey ,
Valentino R. Cooper  and
Miaofang Chi
Mark P. Oxley
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Axiel Yael Birenbaum
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Tribhuwan Pandey
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Valentino R. Cooper
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA.
Miaofang Chi
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge TN, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 116 - 117
Copyright
© Microscopy Society of America 2018 

References

References:

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[7] This research was supported by the US Department of Energy, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, and ORNL’s Center for Nanophase Materials Sciences, which is a U.S. DOE Office of Science User Facility.Google Scholar