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X-Ray Radiation Damage of Polymers in a Scanning Transmission X-Ray Microscope

Published online by Cambridge University Press:  02 July 2020

T. Coffey ,
H. Ade ,
S. Urquhart  and
A.P. Smith
T. Coffey
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695-8202
H. Ade
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695-8202
S. Urquhart
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695-8202
A.P. Smith
Affiliation:
Dept. of Physics, North Carolina State University, Raleigh, NC 27695-8202
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Extract

We use the Scanning Transmission X-ray Microscope (STXM) at the National Synchrotron Light Source (NSLS) (1) to acquire images and spectra of polymers. To interpret data correctly, the effects X-ray radiation has on polymers must be understood. We have therefore started to characterize radiation damage in a variety of carbonyl containing polymers in two ways. First, we want to ascertain the critical dose for mass loss and the critical dose for the carbonyl in a variety of polymers and relate the critical dose to the polymer structure. (The critical dose is the radiation dose at which the optical density of the material is decreased by 1/e of its original value.) We also want to understand the damage mechanism. STXM acquires images and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra by using X-ray photons to excite inner shell electrons to unoccupied valence orbitals or to the continuum.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 370 - 371
Copyright
Copyright © Microscopy Society of America

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References

1. Jacobsen, C. et al., Optics Communications 86, 351—364 (1991).CrossRefGoogle Scholar

2. Laibinis, P. et al., Science 254, 981—983 (1991).CrossRefGoogle Scholar

3. This Work Is Supported By A Gaann Fellowship And By National Science Foundation Award (Dmr- 9458060).Google Scholar