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X-Ray Microscopy Developments at the ESRF

Published online by Cambridge University Press:  02 July 2020

B. Kaulich ,
S. Oestreich ,
R. Barrett  and
J. Susini
B. Kaulich
Affiliation:
European Synchrotron Radiation Facility, BP220, F-38043 Grenoble Cedex, France
S. Oestreich
Affiliation:
European Synchrotron Radiation Facility, BP220, F-38043 Grenoble Cedex, France
R. Barrett
Affiliation:
European Synchrotron Radiation Facility, BP220, F-38043 Grenoble Cedex, France
J. Susini
Affiliation:
European Synchrotron Radiation Facility, BP220, F-38043 Grenoble Cedex, France
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Extract

The ESRF source properties offer the required coherence and brilliance to extend X-ray microscopy techniques, which have been extensively used in the soft X-ray region, to higher energies. This will enable new investigations such as the study of thicker specimens compared to the soft X-ray region, access to absorption edges of elements of major interest in the biological and materials sciences, in particular from Potassium to Chromium, the use of X-ray fluorescence for trace element mapping with high spatial resolution and the application of phase contrast.

Two microscopes are under development at the ESRF to cover a wide range of biological and material sciences applications:

A scanning transmission X-ray microscope (STXM) working in the photon energy range of 0.5-8keV. Whilst in its simplest form this might consist of taking multiple images of a single sample region at different incident energies, an interesting extension is to perform highly spatially resolved XAS scans on small regions of the sample.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 374 - 375
Copyright
Copyright © Microscopy Society of America

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References

1.Susini, J. and Barrett, R.; in: (Eds.) Thieme, J., Schmahl, G., Umbach, E. and Rudolph, D.: X-ray microscopy and Spectromicroscopy (XRM 96), Springer-Verlag (1998).Google Scholar
2.Niemann, B.; in: (Eds.) Aristov, V.V. and Erko, A.I.: X-Ray Microscopy IV, Bogorodski Pechatnik Publishing, Moskow (1994).Google Scholar
3.Kaulich, B.; in: (Eds.) Thieme, J., Schmahl, G., Umbach, E. and Rudolph, D.: X-ray Microscopy ad Spectromicroscopy (XRM 96), Springer-Verlag (1998).Google Scholar