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X Ray Spectra Simulation For Wds : Application to Electron Microprobe Automation

Published online by Cambridge University Press:  02 July 2020

C. Fournier ,
P.-F. Staub  and
C. Merlet
C. Fournier
Affiliation:
CAMECA, 103 Bd. St-Denis, 92403, Courbevoie, cedex, France.
P.-F. Staub
Affiliation:
CAMECA, 103 Bd. St-Denis, 92403, Courbevoie, cedex, France.
C. Merlet
Affiliation:
ISTEEM, CNRS, Universite de Montpellier II, PI. E. Bataillon, 34095, Montpellier, Cedex 5
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Abstract

Experimental conditions and setting up of an electron microprobe is directly linked to the assumption or the knowledge that can make the operator on the results of the measurements. Consequently, there is an increasing interest in modelling the X-ray spectrum in order to predict accurately and rapidly the response of the microprobe when a sample of approximately known composition is submitted to specific excitation conditions. Even if the spectra simulation is a current tool proposed in EDS, it always remains a challenge to create a complete absolute WDS spectrum. Indeed, the definition of the efficiency function was a limit to the calculation of absolute intensities.

In this work, we propose a new generation software for EPMA which uses the absolute simulation spectra to assist the operator in the choices of experimental conditions to achieve accurate measurements in a short time as well as to create new functionalities.

Type
Quantitative X-Ray Microanalysis in the Microprobe, in the SEM and in The ESEM:Theory and Practice (Organized by R. Gauvin and E. Lifshin)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 674 - 675
Copyright
Copyright © Microscopy Society of America 2001

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