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Using Electron Diffraction Technique to Solve Real World Problems

Published online by Cambridge University Press:  02 July 2020

Z. G. Li
Z. G. Li*
Affiliation:
Central Research & Development, DuPont Company, Wilmington, DE19880-0228
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Abstract

Electron diffraction can be a very useful technique in solving real world structure-related problems. However, electron diffraction is much less widely used in industry compared to x-ray diffraction for several reasons. So far, application of electron diffraction has been limited to large-sized companies either to characterize newly synthesized materials in a research division or to directly support business activities in an analytical laboratory. New materials produced on a commercial scale are more and more complex with micro-, even nano-meter sized structures. Development of these materials on a commercial scale, for example, high temperature superconducting compounds, fullerenes, and giant magneoresistance devices [1-7], has increased demand for electron diffraction techniques considerably. Here, I would like to review how electron microscopists in industry solve their real world problems using electron diffraction techniques [8].

Unit cell determination. Unit cell parameters and atom coordinates of a crystal can be routinely determined by single crystal x-ray technique if the crystal is large enough (about 0.1 mm in size).

Type
Microscopy in the Real World: Alloys and Other Materials
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 554 - 555
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Bednorz, J. and Miller, K., Z. Phys. B, 64 (1986)189.CrossRefGoogle Scholar
2.Chen, C. H. et al., Physica C, 175 (1991)301.CrossRefGoogle Scholar
3.Ami, T. et al., Physica C, 1003 (1994)235.Google Scholar
4.Kratschmer, W. et al., Nature, 347 (1990)354.CrossRefGoogle Scholar
5.Iijima, S., Nature, 354 (1991) 56.CrossRefGoogle Scholar
6.Baibich, M. et al., Phys. Rev. Lett., 61 (1988)2472.CrossRefGoogle Scholar
7.Parkin, S. S. et al., Phys. Rev. Lett., 64 (1990) 2304.CrossRefGoogle Scholar
8.Li, Z. G., in Chung, F. and Smith, D., eds. Industrial applications of x-ray diffraction, New YorkMarcel Dekker (2000)733.Google Scholar
9.Higgins, J. B. et al., Zeolites, 8 (1988)446.CrossRefGoogle Scholar
10.Li, Z. G. et al., J. Catalysis, 171 (1997)506.CrossRefGoogle Scholar
11.Li, Z. G. and Carcia, P. F., Ultramicroscopy, 47 (1992)313.CrossRefGoogle Scholar
12.Farrow, R. C. et al., Inst. Phys. Conf. Ser. 100 (1989)259.Google Scholar
13.Pan, M. and Crozier, P., Ultramicroscopy 48 (1993)332.CrossRefGoogle Scholar
14.Lobo, R. F. et al., Science, 262 (1993)1543.CrossRefGoogle Scholar
15.Liu, J. et al., in Bailey, G. W. ed., Microscopy Society of American Proc. (1993)1058.Google Scholar