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The Use of ELNES for Microanalysis

Published online by Cambridge University Press:  02 July 2020

A.J. Craven  and
M. MacKenzie
A.J. Craven
Affiliation:
Department of Physics and Astronomy, University of Glasgow, Glasgow, G12 8QQ, Scotland.
M. MacKenzie
Affiliation:
Department of Physics and Astronomy, University of Glasgow, Glasgow, G12 8QQ, Scotland.
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Extract

The performance of many materials systems depends on our ability to control the distribution of atoms on a nanometre or sub-nanometre scale within those systems. This is as true for steels as it is for semiconductors. A key requirement for improving their performance is the ability to determine the distribution of the elements resulting from processing the material under a given set of conditions. Analytical electron microscopy (AEM) provides a range of powerful techniques with which to investigate this distribution. By combining information from different techniques, many of the ambiguities of interpretation of the data from an individual technique can be eliminated. The electron energy loss near edge structure (ELNES) present on an ionisation edge in the electron energy loss spectrum reflects the local structural and chemical environments in which the particular atomic species occurs. Thus it is a useful contribution to the information available. Since a similar local environment frequently results in a similar shape, ELNES is useful as a “fingerprint”.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 664 - 665
Copyright
Copyright © Microscopy Society of America

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References

1.Ahn, C.C. and Krivanek, O.L., in The EELS Atlas ASU HREM Facility and GATAN (1983).Google Scholar
2.Craven, A.J.et al., IOP Conf. Ser. 153 (1997) 605.Google Scholar
3.Craven, A.J. and Garvie., L.A.J.Micrsoc. Microanal. Microstruct. 6 (1995) 89.CrossRefGoogle Scholar
4.Craven., A.J.J. Microsc. 180 (1995) 250.CrossRefGoogle Scholar
5. This research was supported by the EPSRC under grant GR/K93600.Google Scholar