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Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

Published online by Cambridge University Press:  23 November 2012

A.Y. Borisevich ,
Y. Kim ,
M.P. Oxley ,
S.J. Pennycook ,
S.V. Kalinin ,
A. Morozovska ,
E. Eliseev ,
Y. Chu  and
P. Yu
A.Y. Borisevich
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
Y. Kim
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
M.P. Oxley
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S.V. Kalinin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
A. Morozovska
Affiliation:
National Academy of Sciences, Kiev, Ukraine
E. Eliseev
Affiliation:
National Academy of Sciences, Kiev, Ukraine
Y. Chu
Affiliation:
National Chiao Tung University, Hsinchu, Taiwan
P. Yu
Affiliation:
University of California-Berkely, Berkely, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 318 - 319
Copyright
Copyright © Microscopy Society of America 2012

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