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Three-Dimensional Analysis by Electron Diffraction Methods of Nanocrystalline Materials

Published online by Cambridge University Press:  04 November 2011

Christoph Gammer ,
Clemens Mangler ,
Hans-Peter Karnthaler  and
Christian Rentenberger
Christoph Gammer*
Affiliation:
University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, 1090 Vienna, Austria
Clemens Mangler
Affiliation:
University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, 1090 Vienna, Austria
Hans-Peter Karnthaler
Affiliation:
University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, 1090 Vienna, Austria
Christian Rentenberger
Affiliation:
University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, 1090 Vienna, Austria
*
Corresponding author. E-mail: [email protected]
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Abstract

To analyze nanocrystalline structures quantitatively in 3D, a novel method is presented based on electron diffraction. It allows determination of the average size and morphology of the coherently scattering domains (CSD) in a straightforward way without the need to prepare multiple sections. The method is applicable to all kinds of bulk nanocrystalline materials. As an example, the average size of the CSD in nanocrystalline FeAl made by severe plastic deformation is determined in 3D. Assuming ellipsoidal CSD, it is deduced that the CSD have a width of 19 ± 2 nm, a length of 18 ± 1 nm, and a height of 10 ± 1 nm.

Keywords

nanocrystalline materialselectron diffraction3D analysisintermetallic FeAlcoherently scattering domain sizesevere plastic deformation
Type
Software and Techniques Development
Information
Microscopy and Microanalysis , Volume 17 , Issue 6 , December 2011 , pp. 866 - 871
Copyright
Copyright © Microscopy Society of America 2011

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References

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