Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-12-04T10:05:25.585Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM and SEM Investigation on Oxidised Ge-based Clathrates

Published online by Cambridge University Press:  03 August 2008

C Hébert ,
B Bartova ,
M Cantoni ,
U Aydemir  and
M Baitinger
C Hébert
Affiliation:
Ecole Polytecnique Fédérale, Switzerland
B Bartova
Affiliation:
Ecole Polytecnique Fédérale, Switzerland
M Cantoni
Affiliation:
Ecole Polytecnique Fédérale, Switzerland
U Aydemir
Affiliation:
Max Planck Institute for Chemical Physics of Solids, Germany
M Baitinger
Affiliation:
Max Planck Institute for Chemical Physics of Solids, Germany
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1142 - 1143
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)