Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-08T02:39:01.755Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM and FESEM: The Right Combination for Enhanced Particle Characterization

Published online by Cambridge University Press:  03 August 2008

KL Bunker ,
D McAllister ,
KA Allison ,
K Wagner ,
K Rickabaugh ,
AM Levine ,
BR Strohmeier  and
RJ Lee
KL Bunker
Affiliation:
RJ Lee Group, Inc
D McAllister
Affiliation:
RJ Lee Group, Inc
KA Allison
Affiliation:
RJ Lee Group, Inc
K Wagner
Affiliation:
RJ Lee Group, Inc
K Rickabaugh
Affiliation:
RJ Lee Group, Inc
AM Levine
Affiliation:
RJ Lee Group, Inc
BR Strohmeier
Affiliation:
RJ Lee Group, Inc
RJ Lee
Affiliation:
RJ Lee Group, Inc
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 580 - 581
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)