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Techniques for Studying Nanoparticle Sintering by Plan-View In Situ Transmission Electron Microscopy

Published online by Cambridge University Press:  28 July 2005

M. Yeadon ,
J.C. Yang ,
R.S. Averback  and
J.M. Gibson
M. Yeadon
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Avenue, Urbana, IL 61801 Institute of Materials Research and Engineering and Department of Materials Science, National University of Singapore, Singapore 119260, Republic of Singapore
J.C. Yang
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Avenue, Urbana, IL 61801
R.S. Averback
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Avenue, Urbana, IL 61801
J.M. Gibson
Affiliation:
Materials Research Laboratory, University of Illinois, 104 S. Goodwin Avenue, Urbana, IL 61801
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Abstract

We discuss various techniques for the characterization of supported nanoparticles by in situ plan-view transmission electron microscopy. In particular, we discuss here mechanisms of image contrast formation by particles undergoing reorientation on the surface of a single crystal substrate. We consider reorientation by a variety of mechanisms including rotation, sintering and grain growth, and surface diffusion. Experimental observations are presented and the data compared with theoretical predictions.

Keywords

nanoparticlein situtransmission electron microscopyplan-viewultra-high vacuumsintering
Type
1998 ASU ELECTRON MICROSCOPY WORKSHOP
Information
Microscopy and Microanalysis , Volume 4 , Issue 3 , June 1998 , pp. 248 - 253
Copyright
© 2005 Microscopy Society of America

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