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Study of Co2MnxFe1-xSi Heusler Alloy by Cs-corrected STEM Imaging and Atomic resolution X-ray Spectrum Imaging

Published online by Cambridge University Press:  23 November 2012

P. Zhang ,
Z. Diao ,
H. Wang ,
B. Jiang ,
D. Delille  and
C. Kisielowski
P. Zhang
Affiliation:
Western Digital Corporation, Fremont, CA
Z. Diao
Affiliation:
Western Digital Corporation, Fremont, CA
H. Wang
Affiliation:
Western Digital Corporation, Fremont, CA
B. Jiang
Affiliation:
FEI Company, Hillsboro, OR
D. Delille
Affiliation:
FEI Company, Eindhoven, Netherlands
C. Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 364 - 365
Copyright
Copyright © Microscopy Society of America 2012

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