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Structural Characterization of Vanadium Carbide Using Core Ionization Electron Energy Loss Spectroscopy (Cieels) in Transmission Mode

Published online by Cambridge University Press:  02 July 2020

C. González-Valenzuela ,
F. Espinosa-Magaña ,
F. Paraguay D.  and
A. Duarte-Moller
C. González-Valenzuela
Affiliation:
Centro de Investigatión en Materiales Avanzados, S. C. Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua, Ch., 31109, México
F. Espinosa-Magaña
Affiliation:
Centro de Investigatión en Materiales Avanzados, S. C. Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua, Ch., 31109, México
F. Paraguay D.
Affiliation:
Centro de Investigatión en Materiales Avanzados, S. C. Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua, Ch., 31109, México
A. Duarte-Moller
Affiliation:
Centro de Investigatión en Materiales Avanzados, S. C. Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua, Ch., 31109, México
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Abstract

Vanadium carbide was purchased as powder at Aldrich with a 99.9% pure. Sample was prepared in the standard method for powder observation in a TEM .EELS experiments were carried out in a Phillips CM 200 STEM equipped with a Gatan 766 PEELS spectrometer. Experimental conditions for acquiring were the follows: a spot size of 500 nm, a chamber length of 400 mm and a detector aperture of 3 mm using a energy dispersion of 0.3 eV/channel with a beam energy of 200 KeV. Acquisition time was around 10 mn. taking an average of 100 spectra.

All the EELS spectra were corrected for background subtraction and multiple scattering deconvolution, before the fine structure analysis. The fine structure range was about 200 eV beyond the C-K edge located at energy loss of 283.8 eV and respect to the VL23-edge located at a energy loss of 513 eV.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 258 - 259
Copyright
Copyright © Microscopy Society of America 2001

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References

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