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Strain Analysis of Compositionally Tailored Interfaces in InAs/GaSb Superlattices by Aberration Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

K. Mahalingam ,
H.J. Haugan ,
G.J. Brown  and
K.G. Eyink
K. Mahalingam
Affiliation:
Air Force Research Laboratory, Wright Patterson AFB, OH
H.J. Haugan
Affiliation:
Air Force Research Laboratory, Wright Patterson AFB, OH
G.J. Brown
Affiliation:
Air Force Research Laboratory, Wright Patterson AFB, OH
K.G. Eyink
Affiliation:
Air Force Research Laboratory, Wright Patterson AFB, OH
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1808 - 1809
Copyright
Copyright © Microscopy Society of America 2012

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