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A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors

Published online by Cambridge University Press:  23 November 2012

M. Rathi ,
P. Ahrenkiel ,
J. Carapella  and
M. Wanlass
M. Rathi
Affiliation:
South Dakota School of Mines and Technology, Rapid City, SD
P. Ahrenkiel
Affiliation:
South Dakota School of Mines and Technology, Rapid City, SD
J. Carapella
Affiliation:
National Renewable Energy Lab, Golden, CO
M. Wanlass
Affiliation:
National Renewable Energy Lab, Golden, CO
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1046 - 1047
Copyright
Copyright © Microscopy Society of America 2012

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