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The sources of contamination of TEM samples and the means for its reduction

Published online by Cambridge University Press:  23 November 2012

C. Soong ,
D. Hoyle ,
M. Malac  and
R. Egerton
C. Soong
Affiliation:
Hitachi High-Technologies Canada, Toronto, Ontario, Canada
D. Hoyle
Affiliation:
Hitachi High-Technologies Canada, Toronto, Ontario, Canada
M. Malac
Affiliation:
National Institute of NanoTechnology, Edmonton, Alberta, Canada
R. Egerton
Affiliation:
National Institute of NanoTechnology, Edmonton, Alberta, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1480 - 1481
Copyright
Copyright © Microscopy Society of America 2012

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