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Si Nano-Meshes Investigated Using Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

G. D. Lian ,
M. E. Curtis ,
P. R. Larson ,
K. L. Hobbs ,
J. C. Keay ,
M. B. Johnson ,
D. A. Blom  and
L. F. Allard Jr.
G. D. Lian
Affiliation:
University of Oklahoma
M. E. Curtis
Affiliation:
University of Oklahoma
P. R. Larson
Affiliation:
University of Oklahoma
K. L. Hobbs
Affiliation:
University of Oklahoma
J. C. Keay
Affiliation:
University of Oklahoma
M. B. Johnson
Affiliation:
University of Oklahoma
D. A. Blom
Affiliation:
Oak Ridge National Laboratory, Tennessee
L. F. Allard Jr.
Affiliation:
Oak Ridge National Laboratory, Tennessee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 352 - 353
Copyright
© 2004 Microscopy Society of America

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