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Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM

Published online by Cambridge University Press:  01 August 2004

Michael A. O'Keefe
Michael A. O'Keefe
Affiliation:
Lawrence Berkeley National Laboratory, California
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 972 - 973
Copyright
© 2004 Microscopy Society of America

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