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Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities

Published online by Cambridge University Press:  01 August 2004

Tolek Tyliszczak ,
A. L. David Kilcoyne ,
J. Alexander Liddle ,
Tony Warwick ,
Adam P. Hitchcock ,
Harald Ade  and
David K. Shuh
Tolek Tyliszczak
Affiliation:
Lawrence Berkeley National Laboratory, California
A. L. David Kilcoyne
Affiliation:
Lawrence Berkeley National Laboratory, California
J. Alexander Liddle
Affiliation:
Lawrence Berkeley National Laboratory, California
Tony Warwick
Affiliation:
Lawrence Berkeley National Laboratory, California
Adam P. Hitchcock
Affiliation:
McMaster University,Canada
Harald Ade
Affiliation:
North Carolina State University
David K. Shuh
Affiliation:
Lawrence Berkeley National Laboratory, California
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1018 - 1019
Copyright
© 2004 Microscopy Society of America

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