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Quantitative HAADF-studies of GaP/Si-interfaces

Published online by Cambridge University Press:  23 November 2012

B. Haas ,
A. Beyer ,
J. Ohlmann ,
W. Stolz  and
K. Volz
B. Haas
Affiliation:
Philipps University Marburg, Marburg, Hessen, Germany
A. Beyer
Affiliation:
Philipps University Marburg, Marburg, Hessen, Germany
J. Ohlmann
Affiliation:
Philipps University Marburg, Marburg, Hessen, Germany
W. Stolz
Affiliation:
Philipps University Marburg, Marburg, Hessen, Germany
K. Volz
Affiliation:
Philipps University Marburg, Marburg, Hessen, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 352 - 353
Copyright
Copyright © Microscopy Society of America 2012

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