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Quantitative Electron Diffraction from Small Volumes

Published online by Cambridge University Press:  02 July 2020

R.D. Twesten  and
J.M. Zuo
R.D. Twesten
Affiliation:
Center for Microanalysis of Materials, Seitz Materials Research Laboratory, Urbana, IL
J.M. Zuo
Affiliation:
Department of Materials Science and Engineering, and Materials Research Laboratory, Univ of Illinois, Urbana, IL
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Abstract

Heterogeneous catalysts are extremely important to the chemical industry. The goal of much current research is to develop predictive models for real world catalysts in order to optimize and exploit new processes. The first step in any predictive modeling is to understand the systems that are currently in use. A key question regarding these materials is the distribution of atoms within the catalyst particle, i.e., are the materials equally distributed within the particle or is there clustering or shelling of the constituents. This is a more general question than just catalytic systems and has applicability to many small cluster problems where normally immiscible systems can be forced to mix or order when confined to small volumes.

EXAFS analysis has provided useful information for these systems; due to the small scattering cross-section and large beam sizes of x-rays, the systems have only been studied as ensemble averages.

Type
Characterization of Catalysts (Organized by S. Bradley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1070 - 1071
Copyright
Copyright © Microscopy Society of America 2001

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References

1 Reifsnyder, S.N. and Lamb., H.H.Journal of Physical Chemistry B, 103, (1999) 321.Beard, B.C. and Ross., P.N.Journal of Physical Chemistry, 90, (1986) 6811.CrossRefGoogle Scholar

2 Cowley, J.M.. Journal of Electron Microscopy, 45, (1996)3.CrossRefGoogle Scholar

2 Work at the Center for Microanalysis of Materials is supported by the US DoE under grant DEFG02-96-ER45439. Microsc. Microanal.Google Scholar