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Quantitative Confocal Sectioning in Double-Corrected STEM Utilizing Electron Energy Loss Spectroscopy and Post-Specimen Cc Correction

Published online by Cambridge University Press:  23 November 2012

P. Ercius ,
H.L. Xin ,
H. Zheng  and
C. Dwyer
P. Ercius
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA
H.L. Xin
Affiliation:
Lawrence Berkeley National Laboratory - Materials Sciences Division, Berkeley, CA
H. Zheng
Affiliation:
Lawrence Berkeley National Laboratory - Materials Sciences Division, Berkeley, CA
C. Dwyer
Affiliation:
Monash University - Monash Center for Electron Microscopy, Monash, Victoria, Australia
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1026 - 1027
Copyright
Copyright © Microscopy Society of America 2012

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