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Quantitative Analysis of Interface Structure by HRTEM

Published online by Cambridge University Press:  02 July 2020

Frank Ernst*
Affiliation:
Department of Materials Science and Engineering, Western Reserve University, 10900 Euclid Avenue, Cleveland, Ohio, 44106-7204, U.S.A.
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Abstract

The development of ‘quantitative’ high-resolution transmission electron microscopy (QHRTEM) has led to considerable progress in analyzing and understanding the atomistic structure of grain boundaries and heterointerfaces, which often control relevant macroscopic properties of materials. The following results of recent experimental studies and the comparison of these results with atomistic modeling demonstrate the strength of QHRTEM:

1.Grain Boundaries in SrTiO3. Some technical applications of SrTiO3 ceramics rely on special electric properties of this material, which originate from segregation of electrically active point defects to grain boundaries. QHRTEM can substantially contribute to understanding the correlation between the atomistic structure of grain boundaries and the segregation of point defects to these interfaces. As an example for a grain boundary structure solved by QHRTEM, FIGs. la and b present an experimental HRTEM image of the Σ= 3, (111) grain boundary in SrTiO3 and the corresponding atomistic structure as obtained by QHRTEM.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Copyright
Copyright © Microscopy Society of America 2001

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References

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