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Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography

Published online by Cambridge University Press:  23 November 2012

M.R. Johnson ,
D.J. Smith ,
L. Zhou ,
M.R. McCartney  and
D.A. Cullen
M.R. Johnson
Affiliation:
Physics, Arizona State University, Tempe, AZ
D.J. Smith
Affiliation:
Physics, Arizona State University, Tempe, AZ
L. Zhou
Affiliation:
Physics, Arizona State University, Tempe, AZ
M.R. McCartney
Affiliation:
Physics, Arizona State University, Tempe, AZ
D.A. Cullen
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1832 - 1833
Copyright
Copyright © Microscopy Society of America 2012

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