Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-29T02:34:42.291Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantification by SIMS at the nanoscale : NanoSIMS50 latest developments

Published online by Cambridge University Press:  23 November 2012

J. Audinot ,
N. Valle  and
H. Migeon
J. Audinot
Affiliation:
Science and Analysis of Materials, Centre de recherche Public Gabriel Lippmann, Belvaux, Luxembourg
N. Valle
Affiliation:
Science and Analysis of Materials, Centre de recherche Public Gabriel Lippmann, Belvaux, Luxembourg
H. Migeon
Affiliation:
Science and Analysis of Materials, Centre de recherche Public Gabriel Lippmann, Belvaux, Luxembourg
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 984 - 985
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)