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Planar defects in thin films of InGaN

Published online by Cambridge University Press:  23 November 2012

Z. Liliental-Weber ,
K.M. Yu ,
D. Zakharov  and
S. Bedair
Z. Liliental-Weber
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA
K.M. Yu
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA
D. Zakharov
Affiliation:
Birck Nanotechnology Center, Purdue University, West Lafayette, IN
S. Bedair
Affiliation:
USAElectrical and Computer Engineering Department, North Carolina State University, Raleigh, NC
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1486 - 1487
Copyright
Copyright © Microscopy Society of America 2012

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