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On the Contrast of Precipitates Observed with a FE-SEM

Published online by Cambridge University Press:  02 July 2020

Raynald Gauvin  and
Pierre Hovington
Raynald Gauvin
Affiliation:
Département de Génie mécanique, Université de Sherbrooke, Sherbrooke, Québec, CANADAJ1K 2R1.
Pierre Hovington
Affiliation:
Centre de Recherche de 1’Hydro-Québec, Varennes, Québec, CANADAJ3X 1S1
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Extract

It has been shown recently that precipitates as small as 10 nm can be imaged with a FE-SEM using a Through-The-Lens (TTL) SE detector or the so-called Upper Detector (UD). This is a very significant finding because normally, such small precipitates are observed in the TEM where specimen preparation techniques are generally a timely process. However, from Monte Carlo simulations using CASINO, it has been shown that NbC precipitates embedded in Fe as small than 6 nm can be imaged with BE. The experimental demonstration was difficult because no good BSE detectors were available at that time for low energy work.

Recently, a new BSE detector has been developed for low energy work from the GW corporation, the Centaurus BSE detector. This detector is coupled with an HITACHI S-4700 FESEM In this work, images of Mg2Zn precipitates in Al obtained with the UD and the Centaurus BSE detector are compared.

Type
Low Voltage (1-5 kv) X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 316 - 317
Copyright
Copyright © Microscopy Society of America

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References

references

1.Gauvin, R. et Yue, S. (1997), Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 1243–1244.CrossRefGoogle Scholar
2.Gauvin, R., Hovington, P., et Drouin, D. (1997), Scanning,Vol. 19, pp. 1–14.Google Scholar
3.Reimer, L. (1998), Scanning Electron Microscopy, Springier-Verlag, New York, p 160.CrossRefGoogle Scholar
4. Centauraus is a trademark of GW Corporation.Google Scholar