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Nonorthogonal Twining in Epitaxial SrRuO3 Thin Films Grown on (001) LaAlO3

Published online by Cambridge University Press:  02 July 2020

W. Tian
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI48109
J. C. Jiang
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI48109
X. Q. Pan
Affiliation:
Dept. of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI48109
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Abstract

Nonorthogonal twinings have commonly been observed in perovskite oxides such as SrTi03 and BaTi03. Among them, the ﹛111﹜ Σ3 type twining exists with a relative large amount of population and has been extensively studied. By combining quantitative high resolution transmission electron microscopy (HRTEM) and spatially resolved electron energy loss spectroscopy (EELS), one was able to determine the atomic structure of the ﹛111﹜Σ3 twin boundary in these oxides.[l] On the other hand, nonorthogonal twinings in SrRuO3 have been much less studied. SrRu03, a ternary ruthenium metal oxide, has a perovskite-compatible structure and exhibits low electrical resistivity (10-4 Ω•cm), showing an unparallel technique importance in microelectronic applications. Since the properties of material strongly depend on the microstructure and defect configurations, it is important to study the twining structures and their formation mechanisms in SrRuO3 thin films.

Transmission electron microscopy (TEM) was used to study the SrRuO3 thin films grown on (001) LaAlO3 by 90° off-axis rf sputtering.

Type
Applications of Microscopy: Surfaces/Interfaces
Copyright
Copyright © Microscopy Society of America 2001

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References

[1].Recnik, A., Burley, J., Mader, W., Kolar, D. and Rühle, M., Phil. Mag. B 70 (1994) 1021.CrossRefGoogle Scholar