Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-28T20:18:22.919Z Has data issue: false hasContentIssue false
  • English
  • Français

Non-Destructive Examination of Carbon Nanotube AFM Probes by HRTEM

Published online by Cambridge University Press:  01 August 2004

Qi Zhang ,
Jie Tang ,
Guang Yang ,
Gongpu Zhao ,
Otto Zhou  and
L C Qin
Qi Zhang
Affiliation:
University of North Carolina Chapel Hill
Jie Tang
Affiliation:
University of North Carolina Chapel Hill National Institute for Materials Science, Tsukuba, Japan
Guang Yang
Affiliation:
University of North Carolina Chapel Hill
Gongpu Zhao
Affiliation:
University of North Carolina Chapel Hill
Otto Zhou
Affiliation:
University of North Carolina Chapel Hill
L C Qin
Affiliation:
University of North Carolina Chapel Hill
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 548 - 549
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)