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New Approaches to Data Processing for Atomic Resolution EELS

Published online by Cambridge University Press:  23 November 2012

P. Cueva ,
R. Hovden ,
J.A. Mundy ,
H.L. Xin  and
D.A. Muller
P. Cueva
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
R. Hovden
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
J.A. Mundy
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
H.L. Xin
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
D.A. Muller
Affiliation:
Applied Physics, Cornell University, Ithaca, NY
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 970 - 971
Copyright
Copyright © Microscopy Society of America 2012

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