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Nanoscale Characterization of Magnetic Multilayers with Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2004

D J Larson ,
P F Ladwig ,
Y A Chang ,
R L Martens ,
R M Ulfig  and
T F Kelly
D J Larson
Affiliation:
Seagate Technology, Bloomington, Minnesota
P F Ladwig
Affiliation:
Hutchinson Technology, Hutchinson, Minnesota
Y A Chang
Affiliation:
University of Wisconsin, Madison, Wisconsin
R L Martens
Affiliation:
Imago Scientific Instruments, Madison, Wisconsin
R M Ulfig
Affiliation:
Imago Scientific Instruments, Madison, Wisconsin
T F Kelly
Affiliation:
Imago Scientific Instruments, Madison, Wisconsin
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 518 - 519
Copyright
© 2004 Microscopy Society of America

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