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Monodisperse Pbse Nanoparticle Self-Assembling Nanoarrays Before and After Annealing

Published online by Cambridge University Press:  02 July 2020

W.L. Zhou ,
J. Wiemann ,
K.L. Stokes  and
C.J. O’Connor
W.L. Zhou
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA, 70148
J. Wiemann
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA, 70148
K.L. Stokes
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA, 70148
C.J. O’Connor
Affiliation:
Advanced Materials Research Institute, University of New Orleans, New Orleans, LA, 70148
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Abstract

A variety of semiconductor and metal nanoparticles can be synthesized and tunable in size from about 10 to 200 Å using size-selective separation technique. Preparation of monodisperse samples enables systematic characterization of the structural, electron, and optical properties of materials as they evolve from molecular to bulk in the nanometer size range. Sample uniformity makes it possible to manipulate nanocrystals into close-packed, glassy and ordered nanocrystal. At inter-particle separations 5-100 Å, dipole-dipole interactions lead to energy transfer between neighboring nanocrystals, and electronic tunneling between proximal nanocrystals gives rise to dark and photoconductivity. The fabrication of monodisperse ordered nanoarrays with the inter-particle separations less than 5Å will be very important to study its physical properties since interaction between neighboring nanocrystals cause otherwise insulating assemblies to become semiconducting, metallic, or superconducting depending on nanocrystals composition. Here we present the fabrication of monodisperse PbSe nanoarrays with inter-particle distance less than 5 Å and its nanostructure study.

Type
Applications of Microscopy: Surfaces/Interfaces
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 314 - 315
Copyright
Copyright © Microscopy Society of America 2001

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References

1. Gaschler, W. and Murray, C.B. (To be submitted) (2001).Google Scholar

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4. Zhou, W.L., Wiemann, J., Stokes, K. and O'Connor, CJ. (To be submitted) (2001).Google Scholar