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Modification Of a Conventional TEM (CTEM) for Lorentz Microscopy
Published online by Cambridge University Press: 02 July 2020
Extract
We have modified a CTEM in order to perform Lorentz microscopy experiments at high magnification and resolution on magnetic materials. The modification consists of the adaptation of a second side entry goniometer (SEG) to the CTEM (JEOL 200CX STEM) column above the objective lens, in a region of the column where the measured residual magnetic fields are < 0.5 Gauss with the objective lens in a fully excited state (see Figure 1).
With the specimen positioned above the objective lens, it is necessary to increase the excitation of the lens by approximately 20% in order to bring the image into focus. This combination of a specimen positioned above the object pole piece, and the higher objective lens excitation, affects several changes in the optics. First, if a specimen is positioned within the pole piece gap and the objective lens is turned off for Lorentz microscopy purposes, the highest typical magnification achievable is approximately 1,000 X and the resolution is not much better than 0.1μm.
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- Advances in Instrumentation and Performance
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- Copyright © Microscopy Society of America