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Microstructural Characterization of Nb/Inconel 601 Interface Obtained in the Explosive Welding Process

Published online by Cambridge University Press:  28 July 2021

Monika Bugajska*
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta St., 30-059 Krakow, Poland
Anna Sypien
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta St., 30-059 Krakow, Poland
Piotr Bobrowski
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta St., 30-059 Krakow, Poland
Anna Korneva
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta St., 30-059 Krakow, Poland
Jerzy Morgiel
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta St., 30-059 Krakow, Poland
Zygmunt Szulc
Affiliation:
High Energy Technologies Works “Explomet”, 100H Oswiecimska St., 45-641 Opole, Poland
Joanna Wojewoda-Budka
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta St., 30-059 Krakow, Poland
*
*Corresponding author: Monika Bugajska, E-mail: [email protected]
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Abstract

This work presents the microstructure of the cross-section of a newly developed Nb/Inconel 601 weld with particular attention paid to the continuity, morphology of the interface, and the microstructural changes within its vicinity. Both scanning (SEM) and transmission (TEM) electron microscopy techniques are excellent tools to analyze the microstructure that affects both mechanical and corrosion resistance properties of the obtained product. Grain size examination and their orientation together with the character of grain boundaries by the electron backscattered diffraction (EBSD) technique were performed followed by chemical composition determination across the interface with energy-dispersive X-ray spectroscopy (EDS) in SEM. Then, the microstructure observations of the mixed region located at the Nb/Inconel 601 interface using the TEM technique allowed its chemical and phase composition to be revealed.

Type
The XVIIth International Conference on Electron Microscopy (EM2020)
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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