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Microspectroscopy Using a Solid Immersion Lens

Published online by Cambridge University Press:  02 July 2020

C.D. Poweleit
Affiliation:
Dept of Physics and Astronomy, Arizona State University, Tempe, Arizona, 85287-1504, USA
J Menéndez
Affiliation:
Dept of Physics and Astronomy, Arizona State University, Tempe, Arizona, 85287-1504, USA
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Abstract

Oil immersion lenses have been used in optical microscopy for a long time. The light’s wavelength is decreased by the oil’s index of refraction n and this reduces the minimum spot size. Additionally, the oil medium allows a larger collection angle, thereby increasing the numerical aperture. The SIL is based on the same principle, but offers more flexibility because the higher index material is solid. in particular, SILs can be deployed in cryogenic environments. Using a hemispherical glass the spatial resolution is improved by a factor n with respect to the resolution obtained with the microscope’s objective lens alone. The improvement factor is equal to n2 for truncated spheres.

As shown in Fig. 1, the hemisphere SIL is in contact with the sample and does not affect the position of the focal plane. The focused rays from the objective strike the lens at normal incidence, so that no refraction takes place.

Type
Industrial Applications of Optical Spectroscopy in Microanalysis (Organized by F. Adar and A. Whitley)
Copyright
Copyright © Microscopy Society of America 2001

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References

1 Mansfield, S. M. and Kino, G. S., Appl. Phys. Lett. 57, 2615 (1990).CrossRefGoogle Scholar

2 Qiang, Wu, Grober, R. D., Katzer, D. S., Phys. Rev. Lett. 83, 2652 (1999).Google Scholar

3 Stotz, J. A., Freeman, M. R., Rev. of Sci. Instr. 68, 4468 (1997).CrossRefGoogle Scholar

4 Terris, B. D., Mamin, H. J., Rugar, D., Studenmund, W. R., and Kino, G. S., Appl. Phys. Lett. 65, 388 (1994).CrossRefGoogle Scholar

5 Poweleit, C.D., José, Menéndez, Gunther, A., and Goodnick, S., Applied Physics Letters, 73, 2275 (1998).CrossRefGoogle Scholar

6 Logue, F.P.J. Appl. Phys. 81, 536, (1997).CrossRefGoogle Scholar

7 This work was funded in part by the NSF under grants DMR 9503904 and DMR 9521507.Google Scholar

8 This work was funded in part by Eastman Kodak through gift to ASU Foundation.Google Scholar