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Microscopic Analysis of Twin Grain Boundaries in Alumina

Published online by Cambridge University Press:  02 July 2020

S. Nufer ,
A.G. Marinopoulos ,
S. Fabris ,
C. Elsässer ,
W. Kurtz  and
M. Rühle
S. Nufer
Affiliation:
Max-Planck-Institut fiir Metallforschung, Seestr. 92, D-70174, Stuttgart.
A.G. Marinopoulos
Affiliation:
Max-Planck-Institut fiir Metallforschung, Seestr. 92, D-70174, Stuttgart.
S. Fabris
Affiliation:
Max-Planck-Institut fiir Metallforschung, Seestr. 92, D-70174, Stuttgart.
C. Elsässer
Affiliation:
Max-Planck-Institut fiir Metallforschung, Seestr. 92, D-70174, Stuttgart.
W. Kurtz
Affiliation:
Max-Planck-Institut fiir Metallforschung, Seestr. 92, D-70174, Stuttgart.
M. Rühle
Affiliation:
Max-Planck-Institut fiir Metallforschung, Seestr. 92, D-70174, Stuttgart.
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Abstract

Extended structural defects in α-Al2O3 (alumina), a technologically important, complex ceramic material were quantitatively analyzed with respect to grain boundary segregation, atomic and electronic structures using spatially resolved electron energy-loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDS) and first-principles local-density-functional (LDFT) calculations. in this study the results of analytical investigations will be compared with the outcome of LDFT calculations.

The analytical measurements were performed with a dedicated scanning transmission electron microscope (TEM) VG HB501UX, operating at 100 kV and with a typical beam diameter of lnm. For the spatially resolved EELS a parallel electron energy-loss spectrometer (Gatan model 666) with an energy resolution of better than 0.8 eV was used. For the chemical analysis an EDS system (Noran-Gresham with a Si(Li) detector and a Norvar window) was applied. The detection limit of the EDX system for measuring interface excess is in the range of 0.3 atoms/nm2.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 312 - 313
Copyright
Copyright © Microscopy Society of America 2001

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References

1.) Marinopoulos, A.G. and Elsasser, C., Acta mater. 48, 4375 (2000).CrossRefGoogle Scholar

2.) Marinopoulos, A.G., Nufer, S., and Elsasser, C., submitted to Phys. Rev. B.Google Scholar

3.) Nufer, S. et al., submitted to Phys. Rev. Lett.Google Scholar

4.) Fischmeister, H. F. et. al., Rev. Sci. Instrum. 64, 234 (1993).CrossRefGoogle Scholar

5.) Bruley, J., Microsc. Microanal. Microstruct. 4, 23 (1993).CrossRefGoogle Scholar