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Microcalorimeter EDS Measurements of Chemical Shifts in Fe Compounds

Published online by Cambridge University Press:  02 July 2020

D. A. Wollman ,
Dale E. Newbury ,
G. C. Hilton ,
K. D. Irwin ,
L. L. Dulcie ,
N. F. Bergren  and
John M. Martinis
D. A. Wollman
Affiliation:
National Institute of Standards and Technology, Boulder, CO, 80303
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
G. C. Hilton
Affiliation:
National Institute of Standards and Technology, Boulder, CO, 80303
K. D. Irwin
Affiliation:
National Institute of Standards and Technology, Boulder, CO, 80303
L. L. Dulcie
Affiliation:
National Institute of Standards and Technology, Boulder, CO, 80303
N. F. Bergren
Affiliation:
National Institute of Standards and Technology, Boulder, CO, 80303
John M. Martinis
Affiliation:
National Institute of Standards and Technology, Boulder, CO, 80303
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Extract

We report measurements of chemical shifts in the Fe-L x-ray lines of different Fe compounds from xray emission spectra acquired using a microcalorimeter energy dispersive spectrometer (EDS). The observed changes in peak position and relative intensity of the Fe-L x-ray lines are in agreement with measurements obtained using a wavelength dispersive spectrometer (WDS), demonstrating the usefulness of microcalorimeter EDS for high-energy-resolution x-ray microanalysis.

Chemical shifts result from changes in electron binding energies with the chemical environment of atoms. In x-ray spectra, chemical shifts lead to changes in x-ray peak positions, relative peak intensities, and peak shapes. These chemical bonding effects can be significant (with x-ray peak shifts on the order of 1 eV), particularly for x-ray lines resulting from transitions involving valence electrons of light elements such as B and C.

Type
30 Years of Energy Dispersive Spectrometry in Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 196 - 197
Copyright
Copyright © Microscopy Society of America

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References

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