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Measurement of Indium-Content Variation in InGaN/GaN Dot-in-a-Wire Nanostructures by Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  23 November 2012

S.Y. Woo ,
N. Gauquelin ,
G.A. Botton ,
S. Turner  and
Z. Mi
S.Y. Woo
Affiliation:
Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada
N. Gauquelin
Affiliation:
Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada
G.A. Botton
Affiliation:
Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada
S. Turner
Affiliation:
University of Antwerp, Antwerpen, Belgium
Z. Mi
Affiliation:
McGill University, Montreal, Quebec, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1820 - 1821
Copyright
Copyright © Microscopy Society of America 2012

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