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Interpretation of Holographic and Lorentz Images of an Array of Reverse Biased P-N Junctions in a Semi-Infinite Specimen

Published online by Cambridge University Press:  02 July 2020

M. Beleggia ,
R. Capelli  and
G. Pozzi
M. Beleggia
Affiliation:
Department of Physics and Istituto Nazionale per la Fisica della Materia, University of Bologna, viale B. Pichat 6/2, I-40127Bologna, Italy.
R. Capelli
Affiliation:
Department of Physics and Istituto Nazionale per la Fisica della Materia, University of Modena, via Campi 213/A, 41100, Modena, Italy.
G. Pozzi
Affiliation:
Department of Physics and Istituto Nazionale per la Fisica della Materia, University of Bologna, viale B. Pichat 6/2, I-40127Bologna, Italy.
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Extract

The problem of observing reverse-biased p-n junctions by means of transmission electron microscopy techniques is very challenging both from the experimental and theoretical points of view. In particular, in addition to standard Lorentz microscopy techniques, whose image contrast is able to give some information on the region of high field, also holographic methods have been successfully applied and an interference map of the twodimensional phase on the specimen plane obtained.

In this work we consider, in particular, the theoretical and interpretative aspects, as we have improved a model for the electric field associated to a periodic array of alternating p and n stripes lying in a half plane (physically corresponding to an array of zero-width step junctions) by taking into account that the junctions are tilted with respect to the specimen edge.

Type
Electron Holography
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 954 - 955
Copyright
Copyright © Microscopy Society of America

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References

1.Merli, P.G. et al., Phys. Stat. Sol. 30 (1975) 699CrossRefGoogle Scholar
2.Frabboni, S. et al., Ultramicroscopy 23 (1987) 29CrossRefGoogle Scholar
3.Matteucci, G. et al, Adv. Imag. Electr. Phys. 99 (1997) 171CrossRefGoogle Scholar
4.Capiluppi, C. et al., Microsc. Microan. Microstruct. 6 (1995) 647CrossRefGoogle Scholar
5.Merli, P.G. and Pozzi, G., Optik 51 (1978) 39Google Scholar