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Interpretation of Changes in Peak Shape and Position of the Oxygen Kα Characteristic X-Ray Line

Published online by Cambridge University Press:  02 July 2020

I. R. Harrowfield ,
C. M. MacRae ,
V. Rajakumar  and
N. C. Wilson
I. R. Harrowfield
Affiliation:
CSIRO Minerals, Port Melbourne, Australia3207
C. M. MacRae
Affiliation:
CSIRO Minerals, Port Melbourne, Australia3207
V. Rajakumar
Affiliation:
CSIRO Minerals, Port Melbourne, Australia3207
N. C. Wilson
Affiliation:
CSIRO Minerals, Port Melbourne, Australia3207
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Extract

Changes in shape and position of long-wavelength X-ray lines measured by wavelength dispersive spectrometry (WDS) reflect changes in the density of bonding states of the emitting atom. However, some features of soft X-ray spectra are not due to bonding. For example, small peaks on the shorter-wavelength side of a characteristic peak probably arise from double ionization, absorption effects must be considered and there may be artefacts from the diffracting crystal itself. Nonetheless, when there are dramatic shape changes, spectrometry of soft X-rays can usefully augment microanalysis particularly in the study of tiny particulates which may be difficult to prepare for transmission microscopy.5 Two examples of spectrometry of O Kα follow.

Oxidation of very fine TiB2 particulates is a problem in the ceramics industry. The backscattered electron (BSE) micrograph in fig. 1 shows a particle section with a central core of TiB2 and a darker, oxidised rim analysing roughly like a borate, interspersed with brighter regions, probably TiO2.

Type
Quantitative Biological and Materials Microanalysis by Electrons and X-Rays
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 891 - 892
Copyright
Copyright © Microscopy Society of America 1997

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References

Takahashi, H.et al., Adv. X-ray Chem. Anal. Japan 25, (1994) 289.Google Scholar
Adachi, H. and Taniguchi, K., J. Phys. Soc. Japan, 49, No.5, (1980) 1944.10.1143/JPSJ.49.1944CrossRefGoogle Scholar
Kawai, J.et al., Phys Rev. B, 42 No.9, (1990) 5693.10.1103/PhysRevB.42.5693CrossRefGoogle Scholar
Remond, G.et al., Mikrochim. Acta [SuppL] 13, Springer-Verlag (1996) 61.Google Scholar
Scott, V.D. and Love, G.X-ray Spectrometry 25, (1996) 286.10.1002/(SICI)1097-4539(199611)25:6<286::AID-XRS178>3.0.CO;2-H3.0.CO;2-H>CrossRef3.0.CO;2-H>Google Scholar