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Interfacial Microstructure and Crystallographic Orientations of Thick YBa2Cu3O7 Films Deposited on CeO2/LaAlO3 Substrate

Published online by Cambridge University Press:  02 July 2020

Lijun Wu ,
Yimei Zhu ,
M. Suenaga ,
V.F. Solovyov ,
H.J. Wiesmann  and
R.L. Sabatini
Lijun Wu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York11973
Yimei Zhu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York11973
M. Suenaga
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York11973
V.F. Solovyov
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York11973
H.J. Wiesmann
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York11973
R.L. Sabatini
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, New York11973
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Extract

The development of YBa2Cu3O7 (YBCO) thick films on a flexible, textured, metallic substrate has recently attracted considerable scientific and technical interest. It is well known that the interfacial microstructure plays an important role on the formation and alignment of the YBCO films. Thus, understanding the evolution of the phases near the substrate interface will help us to improve the quality of the films. In this study, BaF2, Cu, and Y were deposited on the (001) CeO2/LaAlO3 substrates without external heating in vacuum. Subsequently, a series of these films were annealed at 735°C for preselected time periods and then quenched. Similar to YBCO films on SrTiO3 substrates, (Ba, Y, Cu)(F,O)2 (precursor) and Cu2O phases were formed after annealing for 10 minutes. After 12 hours annealing, the formation of YBCO film was completed.

Type
Films and Coatings
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 434 - 435
Copyright
Copyright © Microscopy Society of America

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References

Work supported by US DOE, under contract No. DE-ACO2-98CH10886.